Micron Corporation • Norwood, MA
Testing & Programming
In-circuit & flying-probe test, functional test development, AOI/X-ray, and production-grade firmware programming—delivered with clear reports and lot-level traceability.
Testing & Programming
In-circuit & flying-probe test, functional test development, AOI/X-ray, and production-grade firmware programming—delivered with clear reports and lot-level traceability.
- In-Circuit (ICT)
- Flying-Probe
- Functional Test
- AOI & X-ray
- JTAG/ISP Programming
- Traceability & Logs
Electrical Test Capabilities
In-Circuit Test (ICT)
Bed-of-nails fixture ICT for throughput and coverage—opens/shorts, values, orientation, powered checks, and boundary-scan integration.
- DFT review for probe access
- Coverage & fail-data logs
- Works with boundary-scan
Flying-Probe Test
Ideal for prototypes and high-mix: no fixture required, rapid program updates, vectorless and powered tests.
- Nail-less access to dense designs
- Quick NPI turnaround
- Effective for low/med volume
Functional Test
Custom fixtures and scripts to validate real-world behavior—power-up, interfaces, sensors, and calibration.
- USB/UART/I²C/SPI/CAN/Ethernet
- DC/load & parametric tests
- Automated result capture
AOI & X-ray Inspection
100% AOI with tuned programs; X-ray for BGAs, QFNs, press-fit and void analysis.
- Polarity & solder quality
- BGA ball integrity
- Image retention on request
Device Programming
Production-Grade Firmware Loading
In-system (ISP) and off-board programming for MCUs, SoCs, and memory with serial numbering and lot control.
- Bootloader & application images
- EEPROM/Flash parameterization
- Per-unit UID, MAC, keys & fuses
Interfaces & Ecosystem
JTAG/SWD, UART, USB DFU, I²C/SPI; familiar with ST, NXP, Microchip, TI, Nordic, Espressif and more.
- Golden-image management
- Secure handling of binaries
- Programming + verification logs
Fixtures, DFT & NPI Support
- DFT feedback: test pads, access, net coverage
- Fixture design & fabrication (ICT/functional)
- First-article tuning; GR&R where applicable
- Change control across ECOs & firmware revs
- Rapid prototype bring-up with flying-probe
- Scale to production ICT/functional
- Clear failure analysis with photos/data
- Actionable rework instructions
Reporting & Traceability
We can include a tailored report pack per lot: test coverage summary, per-unit pass/fail, result values, AOI/X-ray images, programming verification, and traveler linkages. Logs are retained for audit and field returns analysis.
Typical Test Coverage
| Method | Best For | Coverage Highlights |
|---|---|---|
| ICT | Med/High volume | Opens/shorts, values, orientation, powered checks |
| Flying-Probe | NPI/Prototypes | Nail-less access, powered tests, quick changes |
| Functional | System behavior | Interfaces, sensors, calibration, end-of-line |
| AOI/X-ray | Assembly quality | Polarity, solder joints, BGA/QFN voiding |
| Programming | Any volume | Image load + verify, IDs/keys, fuses/options |
Plan Your Test Strategy
Upload your Gerbers, BOM, netlist, and firmware image for a fast DFT review and a test/fixture proposal.
Oops! We could not locate your form.