Micron Corporation • Norwood, MA
Testing & Programming
In-circuit & flying-probe test, functional test development, AOI/X-ray, and production-grade firmware programming—delivered with clear reports and lot-level traceability.
Testing & Programming
In-circuit & flying-probe test, functional test development, AOI/X-ray, and production-grade firmware programming—delivered with clear reports and lot-level traceability.
- In-Circuit (ICT)
- Flying-Probe
- Functional Test
- AOI & X-ray
- JTAG/ISP Programming
- Traceability & Logs
Electrical Test Capabilities
In-Circuit Test (ICT)
Bed-of-nails fixture ICT for throughput and coverage—opens/shorts, values, orientation, powered checks, and boundary-scan integration.
- DFT review for probe access
- Coverage & fail-data logs
- Works with boundary-scan
Flying-Probe Test
Ideal for prototypes and high-mix: no fixture required, rapid program updates, vectorless and powered tests.
- Nail-less access to dense designs
- Quick NPI turnaround
- Effective for low/med volume
Functional Test
Custom fixtures and scripts to validate real-world behavior—power-up, interfaces, sensors, and calibration.
- USB/UART/I²C/SPI/CAN/Ethernet
- DC/load & parametric tests
- Automated result capture
AOI & X-ray Inspection
100% AOI with tuned programs; X-ray for BGAs, QFNs, press-fit and void analysis.
- Polarity & solder quality
- BGA ball integrity
- Image retention on request
Device Programming
Production-Grade Firmware Loading
In-system (ISP) and off-board programming for MCUs, SoCs, and memory with serial numbering and lot control.
- Bootloader & application images
- EEPROM/Flash parameterization
- Per-unit UID, MAC, keys & fuses
Interfaces & Ecosystem
JTAG/SWD, UART, USB DFU, I²C/SPI; familiar with ST, NXP, Microchip, TI, Nordic, Espressif and more.
- Golden-image management
- Secure handling of binaries
- Programming + verification logs
Fixtures, DFT & NPI Support
- DFT feedback: test pads, access, net coverage
- Fixture design & fabrication (ICT/functional)
- First-article tuning; GR&R where applicable
- Change control across ECOs & firmware revs
- Rapid prototype bring-up with flying-probe
- Scale to production ICT/functional
- Clear failure analysis with photos/data
- Actionable rework instructions
Reporting & Traceability
A tailored report pack can include test coverage, per-unit pass/fail results, measured values, AOI/X-ray images, programming verification, and traveler linkages. Logs support audits and field-return analysis.
100%
AOI on SMT
Inspection results and images available in your report pack.
Lot-level
Traceability
Link test records to production lots and travelers.
Per-unit
Programming logs
Document firmware loading and programming verification.
Typical Test Coverage
| Method | Best For | Coverage Highlights |
|---|---|---|
| ICT | Med/High volume | Opens/shorts, values, orientation, powered checks |
| Flying-Probe | NPI/Prototypes | Nail-less access, powered tests, quick changes |
| Functional | System behavior | Interfaces, sensors, calibration, end-of-line |
| AOI/X-ray | Assembly quality | Polarity, solder joints, BGA/QFN voiding |
| Programming | Any volume | Image load + verify, IDs/keys, fuses/options |
Plan Your Test Strategy
Tell us about your testing and programming requirements. Use our RFQ page to share your BOM, Gerbers, drawings, and project details.
Having trouble uploading files? You can also email them to sales@microncorp.com.